ORCID as entered in ROS

Select Publications
2009, 'Measuring the Charge and Spin States of Electrons on Individual Dopant Atoms in Silicon', in Electron Spin Resonance and Related Phenomena in Low-Dimensional Structures, Springer, Germany, pp. 169 - 182, http://dx.doi.org/10.1007/978-3-540-79365-6_9
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