By Professor Nagarajan Valanoor

Book Chapters

Evans PG; Sando D; Valanoor N, 2025, 'Introduction', in X-Ray Scattering Techniques for Epitaxial Oxide Thin Films, Springer Nature Singapore, pp. 1 - 5, http://dx.doi.org/10.1007/978-981-96-5945-6_1

Seyfouri MM; Evans PG; Valanoor N; Sando D, 2025, 'Laboratory X-Ray Diffraction Analysis of Oxide Thin Films', in X-Ray Scattering Techniques for Epitaxial Oxide Thin Films, Springer Nature Singapore, pp. 7 - 48, http://dx.doi.org/10.1007/978-981-96-5945-6_2

Kan D; Cheng CJ; Nagarajan V; Takeuchi I, 2013, 'Structure-property correlations in rare-earth-substituted BiFeO₃ epitaxial thin films at the morphotropic phase boundary', in Functional Metal Oxides New Science and Novel Applications, pp. 195 - 219, http://dx.doi.org/10.1002/9783527654864.ch6

Valanoor N; Cheng C-J; Kan D; Takeuchi I, 2013, 'Structure–Property Correlations in Rare-Earth-Substituted BiFeO3 Epitaxial Thin Films at the Morphotropic Phase Boundary', in Ogale S; Venkatesan V; Blamire M (ed.), Functional Metal Oxides: New Science and Novel Applications, Wiley, pp. 197 - 220, http://www.wiley.com/WileyCDA/WileyTitle/productCd-3527331794.html

Back to profile page