By Professor Ken Butcher

Conference Papers

Butcher KSA; Tansley TL; Li X, 1996, 'X-ray photoelectron spectroscopy depth profiling of aluminium nitride thin films', in SURFACE AND INTERFACE ANALYSIS, JOHN WILEY & SONS LTD, MI, ANN ARBOR, pp. 99 - 104, presented at Surface Analysis 96, MI, ANN ARBOR, 12 June 1996 - 14 June 1996, http://dx.doi.org/10.1002/(SICI)1096-9918(199702)25:2<99::AID-SIA212>3.3.CO;2-L

GRANT SM; SUMNER TJ; WARREN JP; ALEXIEV D; BUTCHER KSA, 1993, 'IMPLICATIONS OF CARRIER MOBILITY LIMITATIONS FOR GAAS AS AN X-RAY-DETECTOR', in Siegmund OHW (ed.), EUV, X-RAY, AND GAMMA-RAY INSTRUMENTATION FOR ASTRONOMY IV, SPIE - INT SOC OPTICAL ENGINEERING, CA, SAN DIEGO, pp. 40 - 50, presented at Conference on EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IV, CA, SAN DIEGO, 11 July 1993 - 12 July 1993, http://dx.doi.org/10.1117/12.162849

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