ORCID as entered in ROS

Select Publications
2015, 'Passivation of Boron-Doped Industrial Silicon Emitters by Thermal Atomic Layer Deposited Titanium Oxide', IEEE Journal of Photovoltaics, 5, pp. 1062 - 1066, http://dx.doi.org/10.1109/JPHOTOV.2015.2434596
,2015, 'A systematic loss analysis method for rear-passivated silicon solar cells', IEEE Journal of Photovoltaics, 5, pp. 619 - 626, http://dx.doi.org/10.1109/JPHOTOV.2014.2388071
,2015, '0.4% absolute efficiency increase for inline-diffused screen-printed multicrystalline silicon wafer solar cells by non-acidic deep emitter etch-back', Solar Energy Materials and Solar Cells, 137, pp. 193 - 201, http://dx.doi.org/10.1016/j.solmat.2015.02.004
,2015, 'Extraction of surface recombination velocity at highly doped silicon surfaces using electron-beam-induced current', IEEE Journal of Photovoltaics, 5, pp. 263 - 268, http://dx.doi.org/10.1109/JPHOTOV.2014.2361025
,2015, 'Investigation of laser ablation on boron emitters for n-type rear-junction PERT type silicon wafer solar cells', Progress in Photovoltaics: Research and Applications, http://dx.doi.org/10.1002/pip.2604
,2015, 'Accurate extraction of the series resistance of aluminum local back surface field silicon wafer solar cells', Solar Energy Materials and Solar Cells, 133, pp. 113 - 118, http://dx.doi.org/10.1016/j.solmat.2014.10.003
,2014, 'A novel approach to investigate bulk carrier lifetime using low frequency fluctuation noise measurement', Semiconductor Science and Technology, 29, http://dx.doi.org/10.1088/0268-1242/29/12/125005
,2014, 'Two-dimensional numerical simulation of boron diffusion for pyramidally textured silicon', Journal of Applied Physics, 116, pp. 184103, http://dx.doi.org/10.1063/1.4901242
,2014, 'Extraction of Surface Recombination Velocity at Highly Doped Silicon Surfaces Using Electron-Beam-Induced Current', IEEE Journal of Photovoltaics, http://dx.doi.org/10.1109/JPHOTOV.2014.2361025
,2014, 'Accurate potential drop sheet resistance measurements of laser-doped areas in semiconductors', Journal of Applied Physics, 116, pp. 134505, http://dx.doi.org/10.1063/1.4895584
,2014, 'Black silicon: Fabrication methods, properties and solar energy applications', Energy and Environmental Science, 7, pp. 3223 - 3263, http://dx.doi.org/10.1039/c4ee01152j
,2014, 'Optical Modeling of Alkaline Saw-Damage-Etched Rear Surfaces of Monocrystalline Silicon Solar Cells', IEEE Journal of Photovoltaics, http://dx.doi.org/10.1109/JPHOTOV.2014.2349657
,2014, 'Laser Chemical Processing of n-Type Emitters for Solid-Phase Crystallized Polysilicon Thin-Film Solar Cells', IEEE Journal of Photovoltaics, http://dx.doi.org/10.1109/JPHOTOV.2014.2349654
,2014, 'Excellent c-Si surface passivation by low- Temperature atomic layer deposited titanium oxide', Applied Physics Letters, 104, http://dx.doi.org/10.1063/1.4885096
,2014, 'Excellent surface passivation of heavily doped p+ silicon by low-temperature plasma-deposited SiOx/SiNy dielectric stacks with optimised antireflective performance for solar cell application', Solar Energy Materials and Solar Cells, 120, pp. 204 - 208, http://dx.doi.org/10.1016/j.solmat.2013.09.004
,2014, 'Extremely low surface recombination velocities on low-resistivity n-type and p-type crystalline silicon using dynamically deposited remote plasma silicon nitride films', Progress in Photovoltaics Research and Applications, 22, pp. 641 - 647, http://dx.doi.org/10.1002/pip.2320
,2014, 'Geometric confinement of directly deposited features on hydrophilic rough surfaces using a sacrificial layer', Journal of Materials Science, 49, pp. 4363 - 4370, http://dx.doi.org/10.1007/s10853-014-8135-1
,2014, 'Impact of Auger recombination parameterisations on predicting silicon wafer solar cell performance', Journal of Computational Electronics, 13, pp. 647 - 656, http://dx.doi.org/10.1007/s10825-014-0583-y
,2014, 'Laser chemical processing of n-type emitters for solid-phase crystallized polysilicon thin-film solar cells', IEEE Journal of Photovoltaics, 4, pp. 1445 - 1451, http://dx.doi.org/10.1109/JPHOTOV.2014.2349654
,2014, 'Optical modeling of alkaline saw-damage-etched rear surfaces of monocrystalline silicon solar cells', IEEE Journal of Photovoltaics, 4, pp. 1436 - 1444, http://dx.doi.org/10.1109/JPHOTOV.2014.2349657
,2014, 'Electrical and Microstructural Analysis of Contact Formation on Lightly Doped Phosphorus Emitters Using Thick-Film Ag Screen Printing Pastes', IEEE Journal of Photovoltaics, http://dx.doi.org/10.1109/JPHOTOV.2013.2291313
,2013, 'Extracting physical properties of arbitrarily shaped laser-doped micro-scale areas in semiconductors', Applied Physics Letters, 103, pp. 262103, http://dx.doi.org/10.1063/1.4856796
,2013, 'Low-temperature surface passivation of moderately doped crystalline silicon by atomic-layer-deposited hafnium oxide films', Ecs Journal of Solid State Science and Technology, 2, pp. N11 - N14, http://dx.doi.org/10.1149/2.026301jss
,2013, 'Unexpectedly high etching rate of highly doped n-type crystalline silicon in hydrofluoric acid', Ecs Journal of Solid State Science and Technology, 2, pp. P380 - P383, http://dx.doi.org/10.1149/2.026309jss
,2013, 'Silicon surface passivation by aluminium oxide studied with electron energy loss spectroscopy', Physica Status Solidi Rapid Research Letters, 7, pp. 937 - 941, http://dx.doi.org/10.1002/pssr.201308081
,2013, 'Accurate characterization of thin films on rough surfaces by spectroscopic ellipsometry', Thin Solid Films, 545, pp. 451 - 457, http://dx.doi.org/10.1016/j.tsf.2013.07.067
,2013, 'Excellent c-Si surface passivation by thermal atomic layer deposited aluminum oxide after industrial firing activation', Journal of Physics D Applied Physics, 46, http://dx.doi.org/10.1088/0022-3727/46/38/385102
,2013, 'Direct laser doping of poly-silicon thin films via laser chemical processing', IEEE Journal of Photovoltaics, 3, pp. 1259 - 1264, http://dx.doi.org/10.1109/JPHOTOV.2013.2278662
,2013, 'Identification of geometrically necessary dislocations in solid phase crystallized poly-Si', Journal of Applied Physics, 114, http://dx.doi.org/10.1063/1.4816563
,2013, 'A fill factor loss analysis method for silicon wafer solar cells', IEEE Journal of Photovoltaics, 3, pp. 1170 - 1177, http://dx.doi.org/10.1109/JPHOTOV.2013.2270348
,2013, 'Integration of β-FeSi2 with poly-Si on glass for thin-film photovoltaic applications', Rsc Advances, 3, pp. 7733 - 7738, http://dx.doi.org/10.1039/c3ra41156g
,2013, 'Excellent boron emitter passivation for high-efficiency Si wafer solar cells using AlOx/SiNx dielectric stacks deposited in an industrial inline plasma reactor', Progress in Photovoltaics Research and Applications, 21, pp. 760 - 764, http://dx.doi.org/10.1002/pip.1259
,2013, 'Medium range order engineering in amorphous silicon thin films for solid phase crystallization', Journal of Applied Physics, 113, http://dx.doi.org/10.1063/1.4807166
,2013, 'Investigation of screen-printed rear contacts for aluminum local back surface field silicon wafer solar cells', IEEE Journal of Photovoltaics, 3, pp. 690 - 696, http://dx.doi.org/10.1109/JPHOTOV.2013.2239701
,2013, 'On the transient amorphous silicon structures during solid phase crystallization', Journal of Non Crystalline Solids, 363, pp. 172 - 177, http://dx.doi.org/10.1016/j.jnoncrysol.2012.12.034
,2013, 'The effect of light soaking on crystalline silicon surface passivation by atomic layer deposited Al2O3', Journal of Applied Physics, 113, http://dx.doi.org/10.1063/1.4775595
,2013, 'Deposition temperature independent excellent passivation of highly boron doped silicon emitters by thermal atomic layer deposited Al2O3', Journal of Applied Physics, 114, pp. 094505, http://dx.doi.org/10.1063/1.4819970
,2013, 'Progress in Surface Passivation of Heavily Doped n-Type and p-Type Silicon by Plasma-Deposited AlOx/SiNx Dielectric Stacks', IEEE Journal of Photovoltaics, 3, pp. 1163 - 1169, http://dx.doi.org/10.1109/JPHOTOV.2013.2270350
,2012, 'Investigation of defect luminescence from multicrystalline Si wafer solar cells using X-ray fluorescence and luminescence imaging', Physica Status Solidi Rapid Research Letters, 6, pp. 460 - 462, http://dx.doi.org/10.1002/pssr.201206412
,2012, 'Enhancement of laser-induced rear surface spallation by pyramid textured structures on silicon wafer solar cells', Optics Express, 20, pp. A984 - A990, http://dx.doi.org/10.1364/OE.20.00A984
,2012, 'Enhancement of laser-induced rear surface spallation by pyramid textured structures on silicon wafer solar cells.', Opt Express, 20, pp. A984 - A990, https://www.ncbi.nlm.nih.gov/pubmed/23326846
,2012, 'Excellent passivation of p + silicon surfaces by inline plasma enhanced chemical vapor deposited SiO x/AlO x stacks', Japanese Journal of Applied Physics, 51, http://dx.doi.org/10.1143/JJAP.51.10NA17
,2012, 'Excellent Passivation of p+Silicon Surfaces by Inline Plasma Enhanced Chemical Vapor Deposited SiOx/AlOxStacks', Japanese Journal of Applied Physics, 51, pp. 10NA17 - 10NA17, http://dx.doi.org/10.7567/jjap.51.10na17
,2012, 'Advanced modeling of the effective minority carrier lifetime of passivated crystalline silicon wafers', Journal of Applied Physics, 112, pp. 054508, http://dx.doi.org/10.1063/1.4749572
,2012, 'Kinetic study of solid phase crystallisation of expanding thermal plasma deposited a-Si:H', Thin Solid Films, 520, pp. 5820 - 5825, http://dx.doi.org/10.1016/j.tsf.2012.04.056
,2012, '19% efficient inline-diffused large-area screen-printed Al-LBSF silicon wafer solar cells', Energy Procedia, 27, pp. 444 - 448, http://dx.doi.org/10.1016/j.egypro.2012.07.091
,2012, 'Review industrial silicon wafer solar cells-Status and trends', Green, 2, pp. 135 - 148, http://dx.doi.org/10.1515/green-2012-0007
,2012, 'Surface passivation of phosphorus-diffused n +-type emitters by plasma-assisted atomic-layer deposited Al 2O 3', Physica Status Solidi Rapid Research Letters, 6, pp. 4 - 6, http://dx.doi.org/10.1002/pssr.201105445
,2012, 'Advanced modelling of silicon wafer solar cells', Japanese Journal of Applied Physics, 51, http://dx.doi.org/10.1143/JJAP.51.10NA06
,2011, 'Polarization analysis of luminescence for the characterization of silicon wafer solar cells', Applied Physics Letters, 98, http://dx.doi.org/10.1063/1.3584857
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